Paper
4 June 2002 Simulation of transient dynamic behavior in laterally coupled VCSEL arrays
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Abstract
A novel, fast simulation tool for transient response is developed to study jitter and noise caused by lateral cavity interactions in VCSEL arrays. The cavity mode profiles, obtained from a paraxial eigenmode analysis, are used to derive fast 1-D rate equations that implement gain confinement, edge clipping, wide angle scattering and diffraction (self-interference) losses. These equations are augmented by lateral coupling terms describing the interactions among nearest neighbor cavities. Slow time scale coupling describes interactions of phase-shifted cavities via mutually induced electric polarization, cross-hole burning and cross-cavity gain due to optical fringe-field interactions. The tool is used to study cavity cross-talk, lateral bit pattern error effects, and the possibility of excitation of long range modulations over the array. Conclusions relating VCSEL packing density to BER, bit suppression by neighboring cavities, and array phase locking are given.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Spilios Riyopoulos "Simulation of transient dynamic behavior in laterally coupled VCSEL arrays", Proc. SPIE 4649, Vertical-Cavity Surface-Emitting Lasers VI, (4 June 2002); https://doi.org/10.1117/12.469232
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CITATIONS
Cited by 3 scholarly publications.
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KEYWORDS
Vertical cavity surface emitting lasers

Phase shift keying

Modulation

Mode locking

Polarization

Combustion

Diffraction

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