Passive and active characterization of hybrid glass substrates for telecommunication applications

Joseph S. Hayden; Robert D. Simpson; Samuel D. Conzone; Robert K. Hickernell; Berton Callicoatt; Alexana Roshko; Norman A. Sanford

doi:10.1117/12.461643

5 April 2002 Passive and active characterization of hybrid glass substrates for telecommunication applications

Joseph S. Hayden, Robert D. Simpson, Samuel D. Conzone, Robert K. Hickernell, Berton Callicoatt, Alexana Roshko, Norman A. Sanford

Author Affiliations +

Proceedings Volume 4645, Rare-Earth-Doped Materials and Devices VI; (2002) https://doi.org/10.1117/12.461643
Event: Symposium on Integrated Optoelectronic Devices, 2002, San Jose, California, United States

Abstract

Phosphate glasses have become increasingly popular for planar waveguide devices owing in part to the development of a number of different commercial compositions with a wide range of optical, physical, chemical and laser properties. In addition, the recent development of low temperature bonding technology has made possible the fabrication of structures involving multiple glasses prepared as a single hybrid substrate. Combined, these new materials and technologies make possible the creation of devices with increasing integration and complexity. Here, we present passive characterization data collected on glass joints prepared with the low temperature bonding technology and active performance data of a hybrid DBR laser where the surface relief grating has been fabricated in the passive glass region of a hybrid substrate.

Citation Download Citation

Joseph S. Hayden, Robert D. Simpson, Samuel D. Conzone, Robert K. Hickernell, Berton Callicoatt, Alexana Roshko, and Norman A. Sanford "Passive and active characterization of hybrid glass substrates for telecommunication applications", Proc. SPIE 4645, Rare-Earth-Doped Materials and Devices VI, (5 April 2002); https://doi.org/10.1117/12.461643

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