Computer simulation of line profile and data processing in diffraction experiments

Tatiana Gurova; Joel R. Teodosio; Joaquim T. Assis; Vladimir I. Monin; Yuri F. Titovets

doi:10.1117/12.456273

18 February 2002 Computer simulation of line profile and data processing in diffraction experiments

Tatiana Gurova, Joel R. Teodosio, Joaquim T. Assis, Vladimir I. Monin, Yuri F. Titovets

Proceedings Volume 4627, Fifth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering; (2002) https://doi.org/10.1117/12.456273
Event: Fifth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, 2001, St. Petersburg, Russian Federation

Abstract

Data processing of a line profile is one of the most important procedures in a diffraction experiment. The main problem is connected with the presence of K_(alpha 1) and K_(alpha 2) wave components in X-ray radiation that produces the principal errors while determining the angular position or width of a diffraction line. By using computer methods in data processing, it is possible to realize effectively the Rachinger method of separation of K_(alpha 1) and K_(alpha 2) components. In this paper, computer simulation of diffraction profiles was used to analyze the possibilities of the Rachinger method. A separation criterion based on searching true principal parameters, namely the distance and intensity interrelation between K_(alpha 1) and K_(alpha 2) components, was proposed. The separation method is incorporated into the data processing for a portable diffractometer developed by authors from Polytechnical Institute (UERJ).The data processing includes control of an experimental procedure for the case of macro and microstress measurements.

Citation Download Citation

Tatiana Gurova, Joel R. Teodosio, Joaquim T. Assis, Vladimir I. Monin, and Yuri F. Titovets "Computer simulation of line profile and data processing in diffraction experiments", Proc. SPIE 4627, Fifth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, (18 February 2002); https://doi.org/10.1117/12.456273

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available