Optocapacity spectroscopy method

V. A. Vasiljev

doi:10.1117/12.447942

15 November 2001 Optocapacity spectroscopy method

V. A. Vasiljev

Proceedings Volume 4605, PECS 2001: Photon Echo and Coherent Spectroscopy; (2001) https://doi.org/10.1117/12.447942
Event: PECS'2001: Photon Echo and Coherent Spectroscopy, 2001, Novgorod, Russian Federation

Abstract

Optocapacity spectroscopy method is offered. This method based on the characteristic of semiconductors to change conduction at the influence of optical radiation. Conduction changing is registered through capacity change between metallic plates, to which fits an under investigation sample. The method is noncontact and allows to research samples of semiconductors, which thickness less, than diffusion length of free carriers of charge.

Citation Download Citation

V. A. Vasiljev "Optocapacity spectroscopy method", Proc. SPIE 4605, PECS 2001: Photon Echo and Coherent Spectroscopy, (15 November 2001); https://doi.org/10.1117/12.447942

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