Alpha particle response characterization of CdZnTe

Mark S. Amman; Julie S. Lee; Paul N. Luke

doi:10.1117/12.450742

18 December 2001 Alpha particle response characterization of CdZnTe

Mark S. Amman, Julie S. Lee, Paul N. Luke

Proceedings Volume 4507, Hard X-Ray and Gamma-Ray Detector Physics III; (2001) https://doi.org/10.1117/12.450742
Event: International Symposium on Optical Science and Technology, 2001, San Diego, CA, United States

Abstract

The coplanar-grid as well as other electron-only detection techniques are effective in overcoming some of the material problems of CdZnTe and, consequently, have led to efficient gamma-ray detectors with good energy resolution while operating at room temperature. The performance of these detectors is limited by the degree of uniformity in both electron generation and transport. Despite recent progress in the growth of CdZnTe material, small variations in these properties remain a barrier to the widespread success of such detectors. Alpha-particle response characterization of CdZnTe crystals fabricated into simple planar detectors is an effective tool to accurately study electron generation and transport. We have used a finely collimated alpha source to produce two-dimensional maps of detector response. A clear correlation has been observed between the distribution of precipitates near the entrance contact on some crystals and their alpha-response maps. Further studies are ongoing to determine the mechanism for the observed response variations and the reason for the correlation. This paper presents the results of these studies and their relationship to coplanar-grid gamma-ray detector performance.

Citation Download Citation

Mark S. Amman, Julie S. Lee, and Paul N. Luke "Alpha particle response characterization of CdZnTe", Proc. SPIE 4507, Hard X-Ray and Gamma-Ray Detector Physics III, (18 December 2001); https://doi.org/10.1117/12.450742

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