Paper
12 December 2001 Characterization of an x-ray laser beam
Sebastien Le Pape, Philippe Zeitoun, Jorge J. G. Rocca, Antoine Carillon, Pierre Dhez, Marc Francois, S. Hubert, Mourad Idir, David Ros
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Abstract
We report in this article the experimental and numerical tools, developed at the LSAI, for a complete characterization of an x-ray laser (XRL) beam. First, a Michelson interferometer has been used to realize a Fourrier transform spectroscopy experiment. A full comprehension of the measured linewidth requires a comparison of the XRL beam amplification in the plasma to raytrace simulation. Results of transient pumping XRL simulations are presented in this article. The last section is dedicated to a description of the XUV Shack-Hartmann wavefront sensor we have developed, and to the study of the capillary discharge XRL beam.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sebastien Le Pape, Philippe Zeitoun, Jorge J. G. Rocca, Antoine Carillon, Pierre Dhez, Marc Francois, S. Hubert, Mourad Idir, and David Ros "Characterization of an x-ray laser beam", Proc. SPIE 4505, Soft X-Ray Lasers and Applications IV, (12 December 2001); https://doi.org/10.1117/12.450599
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Cited by 7 scholarly publications.
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KEYWORDS
Wavefronts

X-ray lasers

Capillaries

Plasma

Wavefront sensors

Extreme ultraviolet

Refraction

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