PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
Simultaneous measurements of the integrated reflectivity of a mica crystal for different orders of reflection have been performed at a predefined Bragg angle of 45 degree(s) with use of a new method. The method is less time consuming than previous techniques and provides data with small statistical errors. It can be readily used for the calibration of x-ray crystal spectrometers. The paper presents experimental results for Bragg reflections up to the 22nd order. The obtained experimental results are compared with theoretical predictions.
Sang Gon Lee,Jun Gyo Bak,Yeong Su Jung,Manfred Bitter,K. W. Hill,O. Wehrhan, andEckhart Foerster
"Measurements of the integrated reflectivity of a mica crystal for different orders of reflection", Proc. SPIE 4501, X-Ray Mirrors, Crystals, and Multilayers, (14 November 2001); https://doi.org/10.1117/12.448492
ACCESS THE FULL ARTICLE
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
The alert did not successfully save. Please try again later.
Sang Gon Lee, Jun Gyo Bak, Yeong Su Jung, Manfred Bitter, K. W. Hill, O. Wehrhan, Eckhart Foerster, "Measurements of the integrated reflectivity of a mica crystal for different orders of reflection," Proc. SPIE 4501, X-Ray Mirrors, Crystals, and Multilayers, (14 November 2001); https://doi.org/10.1117/12.448492