Paper
13 December 2001 New XRMF spectrometer with high resolution and high efficiency using polycapillary x-ray lens and PSPC+
Xunliang Ding, Yiming Yan, Qiuli Pan, Yumei Yan, Yejun He
Author Affiliations +
Abstract
A new spectrometer based on plane crystal wavelength dispersive method using a position sensitive proportional counter (PSPC) in conjunction with x-ray microbeam formed by monolithic polycapillary x-ray focusing lens has been developed. The new spectrometer could be used for XRMF analysis with high sensitivity, high spatial resolution and energy resolution simultaneously. The minimum spot sizes of the Cu-K(alpha) focused by the lens was 50micrometers . The energy resolution of 5.8 eV was obtained for Ti-K(alpha) by means of the spectrometer.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xunliang Ding, Yiming Yan, Qiuli Pan, Yumei Yan, and Yejun He "New XRMF spectrometer with high resolution and high efficiency using polycapillary x-ray lens and PSPC+", Proc. SPIE 4499, X-Ray Micro- and Nano-Focusing: Applications and Techniques II, (13 December 2001); https://doi.org/10.1117/12.450221
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Cited by 1 scholarly publication.
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KEYWORDS
X-rays

Spectroscopy

Crystals

X-ray sources

Spatial resolution

Sensors

Silicon

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