Metrology for the optoelectronics industry

Gordon W. Day

doi:10.1117/12.431251

18 June 2001 Metrology for the optoelectronics industry

Gordon W. Day

Proceedings Volume 4450, Harnessing Light: Optical Science and Metrology at NIST; (2001) https://doi.org/10.1117/12.431251
Event: International Symposium on Optical Science and Technology, 2001, San Diego, CA, United States

Abstract

The National Institute of Standards and Technology (NIST) provides measurement technology, standards, and traceability for much of the optoelectronics industry. This paper covers its support for two major industry segments, the laser industry and the optical communication industry.

Citation Download Citation

Gordon W. Day "Metrology for the optoelectronics industry", Proc. SPIE 4450, Harnessing Light: Optical Science and Metrology at NIST, (18 June 2001); https://doi.org/10.1117/12.431251

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