High-Resolution Line-Intensity Measurements Of The V4 + V5 Band Of Acetylene

Max Loewenstein; James R Podolske; Prasad Varanasi

doi:10.1117/12.937461

26 November 1983 High-Resolution Line-Intensity Measurements Of The V4 + V5 Band Of Acetylene

Max Loewenstein, James R Podolske, Prasad Varanasi

Proceedings Volume 0438, Tunable Diode Laser Development and Spectroscopy Applications; (1983) https://doi.org/10.1117/12.937461
Event: 27th Annual Technical Symposium, 1983, San Diego, United States

Abstract

A diode-laser spectrometer was used to measure individual R-branch line strengths in the (v4 + v5)° combination band of C2H2. A total band strength of Sv = 63 ±2 cm-1/cm atm was found for the normal isotopic composition of C2H2. Broadening parameters for several R-branch lines were determined with N2 and He as the broadening gases.

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Max Loewenstein, James R Podolske, and Prasad Varanasi "High-Resolution Line-Intensity Measurements Of The V4 + V5 Band Of Acetylene", Proc. SPIE 0438, Tunable Diode Laser Development and Spectroscopy Applications, (26 November 1983); https://doi.org/10.1117/12.937461

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