Paper
7 September 2001 Sapphire statistical characterization and risk reduction program
Donald R. McClure, Robert Cayse, David R. Black, Steven M Goodrich, K. Peter D. Lagerloef, Daniel C. Harris, Dale McCullum, Daniel H. Platus, Charles E. Patty Jr., Robert S. Polvani
Author Affiliations +
Abstract
The Sapphire Statistical Characterization and Risk Reduction Program tested 1400 4-point flexure bars with different crystal orientations at different temperatures to establish a mechanical strength database for engineering design. Sapphire coupons were selected to represent surfaces on two different missile windows and a missile dome. Sapphire was obtained from the same suppliers used for the windows or dome and, as much as possible, coupons were fabricated in the same manner as the corresponding part of the window or dome. For one missile window, sapphire from one fabricator was 50% stronger than sapphire made to the same specifications from the same blanks by another fabricator. In laser thermal shock tests, sapphire performed better than predicted from flexure tests. Of several nondestructive methods evaluated for their ability to identify mechanically weak specimens, only x-ray topography was correlated with strength for a limited set of specimens.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Donald R. McClure, Robert Cayse, David R. Black, Steven M Goodrich, K. Peter D. Lagerloef, Daniel C. Harris, Dale McCullum, Daniel H. Platus, Charles E. Patty Jr., and Robert S. Polvani "Sapphire statistical characterization and risk reduction program", Proc. SPIE 4375, Window and Dome Technologies and Materials VII, (7 September 2001); https://doi.org/10.1117/12.439184
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Cited by 2 scholarly publications.
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KEYWORDS
Missiles

Sapphire

Surface finishing

Polishing

X-rays

Crystals

Temperature metrology

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