Paper
10 October 2001 Analysis of the effects of 1/f noise and choppers on the performance of DC-coupled thermal imaging systems
Author Affiliations +
Abstract
It has long been known that 1/f noise is the bane of staring thermal imaging systems because the detector pixels are sampled at a low data rate. In the frequency range between about one Hertz and an upper limit set by the eye integration time, 1/f noise is quite distracting and detrimental to real-world system performance to an extent greater than would be expected from its impact on NETD. For very low frequencies 1/f noise amounts to drift. Because the noise in individual pixels is uncorrelated with noise in other pixels, this appears as a time-varying spatial noise, which degrades system performance more seriously than temporal noise. This paper quantifies these effects and shows that the electrical integration time is a critical factor in the rate at which 1/f noise degrades MRT after calibration. Use of a chopper reduces or eliminates the spatial noise, but with a sensitivity penalty. These results are particularly apropos to uncooled thermal imaging.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Charles M. Hanson "Analysis of the effects of 1/f noise and choppers on the performance of DC-coupled thermal imaging systems", Proc. SPIE 4369, Infrared Technology and Applications XXVII, (10 October 2001); https://doi.org/10.1117/12.445351
Lens.org Logo
CITATIONS
Cited by 2 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Sensors

Bolometers

Interference (communication)

Eye

Signal to noise ratio

Thermography

Calibration

RELATED CONTENT

Image quality of optical remote sensing data
Proceedings of SPIE (October 13 2014)
An Improved Electro-Optical Image Quality Summary Measure
Proceedings of SPIE (December 28 1981)
Simulation of the image quality of an a Si flat...
Proceedings of SPIE (April 25 2000)
NEQ: its progenitors and progeny
Proceedings of SPIE (March 12 2009)

Back to Top