Characterization of synthetic IR scene generator thermal pixel array

Alan Schumann; Gordon C. Perkins; H. Ronald Marlin; Bruce W. Offord; Richard L. Bates; Chris Hutchens; Derek Yunchih Huang

doi:10.1117/12.438098

31 August 2001 Characterization of synthetic IR scene generator thermal pixel array

Alan Schumann, Gordon C. Perkins, H. Ronald Marlin, Bruce W. Offord, Richard L. Bates, Chris Hutchens, Derek Yunchih Huang

Author Affiliations +

Proceedings Volume 4366, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VI; (2001) https://doi.org/10.1117/12.438098
Event: Aerospace/Defense Sensing, Simulation, and Controls, 2001, Orlando, FL, United States

Abstract

With the increased demand for IR sensor and surveillance systems, there is a growing need for technologies to support their operational readiness. Measurement of sensor characteristics such as sensitivity, MRTD, and dynamic range should be standard in all mission critical systems. The Real-Time Infrared Test Set (RTIR) is a portable system designed to provide in-the-field calibration and testing of IR imaging systems and seekers. RTIR uses the high volume manufacturing processes of the Very Large Scale Integration and the Micro Electromechanical Systems technology to produce a Thermal Pixel Array (TPA). State-of-the-art CMOS processes define all the necessary on-chip digital and analog electronics. When properly driven, this array generates variable temperature, synthetic IR scenes. A nonuniformity measurement of several TPAs is presented.

Citation Download Citation

Alan Schumann, Gordon C. Perkins, H. Ronald Marlin, Bruce W. Offord, Richard L. Bates, Chris Hutchens, and Derek Yunchih Huang "Characterization of synthetic IR scene generator thermal pixel array", Proc. SPIE 4366, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VI, (31 August 2001); https://doi.org/10.1117/12.438098

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