Source of intense beam of ions with low energy

I. S. Gasanov

doi:10.1117/12.407752

28 November 2000 Source of intense beam of ions with low energy

I. S. Gasanov

Proceedings Volume 4340, 16th International Conference on Photoelectronics and Night Vision Devices; (2000) https://doi.org/10.1117/12.407752
Event: XVI International Conference on Photoelectronics and Night Vision Devices, 2000, Moscow, Russian Federation

Abstract

The plasmaoptical system of ion extraction allowed to form the ion beams, where the current is independent from extraction voltage, is analyzed. The temperature of discharge electrons ensured the equipotentiality of the magnetic field lines determines the minimal energy of beam. The offered source of tape beam will be used for those purposes, which require the large currents of ions with low energy.

Citation Download Citation

I. S. Gasanov "Source of intense beam of ions with low energy", Proc. SPIE 4340, 16th International Conference on Photoelectronics and Night Vision Devices, (28 November 2000); https://doi.org/10.1117/12.407752

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