Paper
10 October 2000 Novel image connection method used in the measurement of geometrical parameters
Yuchi Lin, Xiaobing Niu, Meirong Zhao, Li Wen
Author Affiliations +
Proceedings Volume 4222, Process Control and Inspection for Industry; (2000) https://doi.org/10.1117/12.403844
Event: Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments, 2000, Beijing, China
Abstract
The measurement of geometrical parameters using image measurement technology is used widely in the industrial test and measurement. Usually a work-piece is measured mostly by a larger aperture system, whose aperture is not smaller than the work-piece. To a large work-piece, however, it is not practical to make so large an aperture and to keep accurate. A novel method named One Point and One Line (OPOL) working on 2D image connection is proposed here, through which parts of images about the work-piece sampled at first can be connected by the computer so that a total image containing abundant information should come into being. And on the basis of the total image, all of the measuring tasks are carried out quickly and efficiently by pre0established manmade feature objects and implementing subpixel analysis based on polynomial interpolation and polyfitting.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yuchi Lin, Xiaobing Niu, Meirong Zhao, and Li Wen "Novel image connection method used in the measurement of geometrical parameters", Proc. SPIE 4222, Process Control and Inspection for Industry, (10 October 2000); https://doi.org/10.1117/12.403844
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KEYWORDS
CCD cameras

Charge-coupled devices

Image processing

Ytterbium

Algorithm development

CCD image sensors

Digital imaging

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