Paper
11 October 2000 New hierarchical approach to pattern matching for industrial applications
Markus Brandner, Axel J. Pinz, Wolfgang Poelzleitner
Author Affiliations +
Abstract
In this paper a new hierarchical structure for fast, robust geometry-based pattern matching is proposed. As opposed to many pattern matching systems reported in the literature we use a structure comprising a number of alternating feature processing and constraint layers. Feature extraction accuracy ranges from coarse at the bottom of the structure to a fine level at the top. A 2D quasi-affine matching system based on the proposed structure has been implemented. Experiments show the reduction in the amount of image data being processed in every layer of the structure as a consequence of applying constraints to the data between two adjacent feature extraction layers. The structure is able to utilize scalable feature extraction algorithms as well as the incorporation of a priori knowledge into the feature extraction.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Markus Brandner, Axel J. Pinz, and Wolfgang Poelzleitner "New hierarchical approach to pattern matching for industrial applications", Proc. SPIE 4197, Intelligent Robots and Computer Vision XIX: Algorithms, Techniques, and Active Vision, (11 October 2000); https://doi.org/10.1117/12.403771
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Image processing

Feature extraction

Data processing

Systems modeling

Optical inspection

Sensors

Solid modeling

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