Paper
22 January 2001 High-accuracy laser mask repair system LM700A
Yoichi Yoshino, Yukio Morishige, Shuichi Watanabe, Yukio Kyusho, Atsushi Ueda, Tutomu Haneda, Makoto Ohmiya
Author Affiliations +
Abstract
High throughput laser mask repair system satisfying the accuracy demanded for 0.5 jum pattern rule reticles has been newly developed. The named Laser Mask Repair LM700A has the following features: ? Opaque defect repair capability of 0.5 ?m L&S patterns ? High repair accuracy of 45 nm (3 sigma) ? Quartz damage depth of less than 20nm ? Transmission at the repair site of more than 96% ? Pico-second solid state UV pulse laser and high resolution UV Optics Laser wavelength : 351 nm Laser pulse duration : less than 300 ps Observation wavelength : 365 nm By utilizing a pico-second UV pulse laser, very high quality laser zapping can be obtained. This paper presents the configuration and the evaluated results for mask repair performance in conventional Cr binary masks.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yoichi Yoshino, Yukio Morishige, Shuichi Watanabe, Yukio Kyusho, Atsushi Ueda, Tutomu Haneda, and Makoto Ohmiya "High-accuracy laser mask repair system LM700A", Proc. SPIE 4186, 20th Annual BACUS Symposium on Photomask Technology, (22 January 2001); https://doi.org/10.1117/12.410680
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Cited by 3 scholarly publications.
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KEYWORDS
Chromium

Pulsed laser operation

Laser systems engineering

Laser development

Laser optics

Ultraviolet radiation

Binary data

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