Paper
9 November 2000 Characterization of semiconductor Bragg gratings for optical sensor applications
Author Affiliations +
Proceedings Volume 4185, Fourteenth International Conference on Optical Fiber Sensors; 418538 (2000) https://doi.org/10.1117/12.2302259
Event: Fourteenth International Conference on Optical Fiber Sensors, 2000, Venice, Italy
Abstract
The use of rigorous numerical methods shows that the widely used coupled mode theory is inadequate for the characterisation of semiconductor Bragg grating devices. Simulated results for various types of grating devices are presented.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
B. M. A. Rahman "Characterization of semiconductor Bragg gratings for optical sensor applications", Proc. SPIE 4185, Fourteenth International Conference on Optical Fiber Sensors, 418538 (9 November 2000); https://doi.org/10.1117/12.2302259
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KEYWORDS
Bragg gratings

Semiconductors

Apodization

Finite element methods

Semiconductor lasers

Beam propagation method

Optical sensors

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