Improvement of structural stability and IR-detecting characteristics of microbolometer

HoKwan Kang; W. H. Ha; C. W. Park; Byung-Kap Kim; Sung W. Moon; ToHoon Kim

doi:10.1117/12.396452

25 August 2000 Improvement of structural stability and IR-detecting characteristics of microbolometer

HoKwan Kang, W. H. Ha, C. W. Park, Byung-Kap Kim, Sung W. Moon, ToHoon Kim

Proceedings Volume 4174, Micromachining and Microfabrication Process Technology VI; (2000) https://doi.org/10.1117/12.396452
Event: Micromachining and Microfabrication, 2000, Santa Clara, CA, United States

Abstract

A rounded-shape sacrificial layer side-wall and multi-layer of IR detecting layer composed of vanadium/vanadium oxide/vanadium were demonstrated for uncooled type micro bolometer fabrication using surface micromachining in technology. The improvement of structural stability of floating micro bolometer structure was achieved by reducing supporting bridge angle up to 50 degrees. Also smoothly rounded bridge allows more efficient residual stress releasing and flatness of floating structure without distortion. The rounded side-wall shape reduces stress concentration of wall edge and was achieved by plasma treatment of sacrificial polyimide. The IR detecting characteristics was also improved by means of fabricating an IR active layer having a high TCR with low resistivity. We deposited multi-layer of vanadium oxide film as an IR detecting layer by a layer-by-layer technology, which fabricates a sandwich typed or multi-layered vanadium and vanadium oxide using conventional r.f. magneton sputtering system. We easily obtained over -2 percent/K of TCR and 1(omega) -cm of resistivity of VO_x films by new deposition technique.

Citation Download Citation

HoKwan Kang, W. H. Ha, C. W. Park, Byung-Kap Kim, Sung W. Moon, and ToHoon Kim "Improvement of structural stability and IR-detecting characteristics of microbolometer", Proc. SPIE 4174, Micromachining and Microfabrication Process Technology VI, (25 August 2000); https://doi.org/10.1117/12.396452

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