Phase-shifting method for two-dimensional birefringence measurement with return-path beams

Michael I. Shribak; Yukitoshi Otani; Toru Yoshizawa

doi:10.1117/12.388464

14 June 2000 Phase-shifting method for two-dimensional birefringence measurement with return-path beams

Michael I. Shribak, Yukitoshi Otani, Toru Yoshizawa

Proceedings Volume 4148, Optoelectronic and Hybrid Optical/Digital Systems for Image and Signal Processing; (2000) https://doi.org/10.1117/12.388464
Event: International Workshop on Optoelectronic and Hybrid Optical/Digital Systems for Image/Signal Processing, 1999, Lviv, Ukraine

Abstract

The paper describes the phase-shifting method for measuring 2D birefringence distributions with return-path polarimeter scheme. Eight or sixteen images in polarized light are processed for determining of specimen's retardance and azimuth distributions. The principal formulas that describe the mathematical processing are presented. The method allows us to find the image of specimen's birefringence with nonuniform distribution of fast axis azimuth and retardance. The method gives the exact solution for any retardance value. Approximation equations for determining of small retardance are presented. The measurement method is highly effective for research of vector or tensor physical fields, which are accompanied by birefringence. For example, inner stresses, electrical and magnetic fields, heat flows, birefringence liquid flows et al.

Citation Download Citation

Michael I. Shribak, Yukitoshi Otani, and Toru Yoshizawa "Phase-shifting method for two-dimensional birefringence measurement with return-path beams", Proc. SPIE 4148, Optoelectronic and Hybrid Optical/Digital Systems for Image and Signal Processing, (14 June 2000); https://doi.org/10.1117/12.388464

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