Linear integer unconcerned phase-maps Fourier-transform profilometry by changing the angle of projection

Jingang Zhong

doi:10.1117/12.498422

7 March 2006 Linear integer unconcerned phase-maps Fourier-transform profilometry by changing the angle of projection

Jingang Zhong

Proceedings Volume 4101, Laser Interferometry X: Techniques and Analysis; (2006) https://doi.org/10.1117/12.498422
Event: International Symposium on Optical Science and Technology, 2000, San Diego, CA, United States

Abstract

The linear integer unconcerned phase-maps fringe projection profilometry has been used to measure the 3-D shape of object with discontinuous height steps. Linear integer unconcerned phase-maps are obtained by changing the angle of grating projected. The technique permits that the frequency of grating is not changed. An automated analysis of the fringe patterns is carried out by the Fourier transform method. Experimental results are presented that demonstrate the validity of the principle.

Citation Download Citation

Jingang Zhong "Linear integer unconcerned phase-maps Fourier-transform profilometry by changing the angle of projection", Proc. SPIE 4101, Laser Interferometry X: Techniques and Analysis, (7 March 2006); https://doi.org/10.1117/12.498422

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