Heisenberg principle applied to fringe analysis

Cesar A. Sciammarella; Federico M. Sciammarella

doi:10.1117/12.498381

7 March 2006 Heisenberg principle applied to fringe analysis

Cesar A. Sciammarella, Federico M. Sciammarella

Proceedings Volume 4101, Laser Interferometry X: Techniques and Analysis; (2006) https://doi.org/10.1117/12.498381
Event: International Symposium on Optical Science and Technology, 2000, San Diego, CA, United States

Abstract

Optical techniques that are used to measure displacements utilize a carrier. When a load is applied the displacement field modulates the carrier. The accuracy of the information that can be recovered from the modulated carrier is limited by a number of factors. In this paper these factors are analyzed and conclusions concerning the limitations in information recovery are illustrated with examples taken from experimental data.

Citation Download Citation

Cesar A. Sciammarella and Federico M. Sciammarella "Heisenberg principle applied to fringe analysis", Proc. SPIE 4101, Laser Interferometry X: Techniques and Analysis, (7 March 2006); https://doi.org/10.1117/12.498381

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