Diffraction strain sensor for micromeasurements

Bing Zhao; Anand Krishna Asundi

doi:10.1117/12.498412

7 March 2006 Diffraction strain sensor for micromeasurements

Bing Zhao, Anand Krishna Asundi

Proceedings Volume 4101, Laser Interferometry X: Techniques and Analysis; (2006) https://doi.org/10.1117/12.498412
Event: International Symposium on Optical Science and Technology, 2000, San Diego, CA, United States

Abstract

In this paper, a novel compact optical diffraction strain sensor using medium density grating foil (500 lines/mm) and high-density diffractive grating (1200 lines/mm) is presented. The grating attached on the surface of a specimen is illuminated by a focused laser beam. The centroids of diffracted beam spots from the grating are automatically determined with two position-sensitive detector (PSD) sensors connected to a personal computer. The shift of second-order diffracted beam spots due to the specimen deformation is then detected. The influences of noise sources and system geometry on system performances, such as sensitivity, spatial resolution, and strain range and measurement linearity are discussed. Strain sensitivity of 1 micro-strain can be achieved. The spatial resolution for strain measurement of 0.4 mm is attainable. The system can be used for continuous measurement and for both static and dynamic test.

Citation Download Citation

Bing Zhao and Anand Krishna Asundi "Diffraction strain sensor for micromeasurements", Proc. SPIE 4101, Laser Interferometry X: Techniques and Analysis, (7 March 2006); https://doi.org/10.1117/12.498412

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KEYWORDS

Diffraction gratings

Sensors

Diffraction

Spatial resolution

CCD image sensors

Interference (communication)

Quantization

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