X-ray investigations of a near surface layer of metal samples

Oleg N. Gilev; Victor E. Asadchikov; Angela Duparre; Nikolai A. Havronin; Igor V. Kozhevnikov; Yury S. Krivonosov; Sergey P. Kuznetsov; Vitaly I. Mikerov; Vladimir I. Ostashev; Vladimir A. Tukarev

doi:10.1117/12.405828

2 November 2000 X-ray investigations of a near surface layer of metal samples

Oleg N. Gilev, Victor E. Asadchikov, Angela Duparre, Nikolai A. Havronin, Igor V. Kozhevnikov, Yury S. Krivonosov, Sergey P. Kuznetsov, Vitaly I. Mikerov, Vladimir I. Ostashev, Vladimir A. Tukarev

Author Affiliations +

Proceedings Volume 4099, Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries; (2000) https://doi.org/10.1117/12.405828
Event: International Symposium on Optical Science and Technology, 2000, San Diego, CA, United States

Abstract

It is demonstrated that the simplest model of a surface, assuming step-like variation of the dielectric permeability at a vacuum-matter interface, does not permit the quantitative description of all the features of x-rays reflection and scattering observed in experiment, even though the effects of the surface roughness are taken into consideration accurately. These features are much more pronounced for metals having a large number of the conductivity electrons which are bound slightly with individual atoms. Evidently, the wave function of the electron gas of a metal cannot abrupt sharply at a surface but decreases gradually into vacuum at a distance of several angstroms. To validate or disprove the hypothesis for the presence of a near surface transition layer of the electron density in metals, a set of experiments is performed. Reflection and scattering of hard and soft x-rays, and cold neutrons (which are sensitive to nuclear density distribution and insensitive to the electron one) from metal samples are measured. The independent measurements of the surface micro-topography are performed with the use of atomic force microscopy. The results obtained demonstrate the presence of a near surface layer, which is caused by gradual change of electron density, with a thickness of several angstroms.

Citation Download Citation

Oleg N. Gilev, Victor E. Asadchikov, Angela Duparre, Nikolai A. Havronin, Igor V. Kozhevnikov, Yury S. Krivonosov, Sergey P. Kuznetsov, Vitaly I. Mikerov, Vladimir I. Ostashev, and Vladimir A. Tukarev "X-ray investigations of a near surface layer of metal samples", Proc. SPIE 4099, Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries, (2 November 2000); https://doi.org/10.1117/12.405828

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available