Modeling mark edge jitter in phase-change recording

Aparna C. Sheila; David N. Lambeth; Tuviah E. Schlesinger

doi:10.1117/12.399338

18 September 2000 Modeling mark edge jitter in phase-change recording

Aparna C. Sheila, David N. Lambeth, Tuviah E. Schlesinger

Proceedings Volume 4090, Optical Data Storage 2000; (2000) https://doi.org/10.1117/12.399338
Event: Optical Data Storage, 2000, Whistler, BC, Canada

Abstract

In this paper, we develop a model for the statistical nature of nucleation in phase change recording media and use it to estimate the mark edge jitter arising from the nucleation process. We then investigate the dependence of mark edge jitter on the erase power and reflection layer thickness.

Citation Download Citation

Aparna C. Sheila, David N. Lambeth, and Tuviah E. Schlesinger "Modeling mark edge jitter in phase-change recording", Proc. SPIE 4090, Optical Data Storage 2000, (18 September 2000); https://doi.org/10.1117/12.399338

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