Paper
29 November 2000 Analysis of characteristics of films with TiOx-TiO2 structure
Jiancheng Zhang, Tiansu Zhang, Yue Shen, Jianming Chen
Author Affiliations +
Proceedings Volume 4086, Fourth International Conference on Thin Film Physics and Applications; (2000) https://doi.org/10.1117/12.408485
Event: 4th International Conference on Thin Film Physics and Applications, 2000, Shanghai, China
Abstract
Ti was prepared on substrates by sputtering methods, then followed by an oxidization step to form TiOx. TiO2 films with dopents (In, Ta and Nb ions etc.) or without, could be directly coated on the surface by TiOx by a sol-gel process to obtain the films with TiOx-TiO2 structure. TiOx films in the oxidation process of Ti were calculated by diffusion equations and analyzed by x-ray diffraction. Crystalline phases, grain size and morphology of TiOx,-TiO2 cross section have been observed by transmission electronic microscopy and scanning electron microscopy, respectively. Raman spectra of the films with the dopants demonstrated existence of anatase phase even in nigher temperature. The electrical properties of the films were analyzed and compared with each other. The results have been explained by transferring theory of the excitons with the structure.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jiancheng Zhang, Tiansu Zhang, Yue Shen, and Jianming Chen "Analysis of characteristics of films with TiOx-TiO2 structure", Proc. SPIE 4086, Fourth International Conference on Thin Film Physics and Applications, (29 November 2000); https://doi.org/10.1117/12.408485
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Diffusion

Niobium

Titanium

Crystals

Ions

Scanning electron microscopy

Sol-gels

RELATED CONTENT


Back to Top