Laser-ablated thin films of infinite-layer compounds and related materials

John T. Markert; Troy C. Messina; Bernard Dam; Jeroen Huijbregste; Jan H. Rector; Ronald Griessen

doi:10.1117/12.397832

6 September 2000 Laser-ablated thin films of infinite-layer compounds and related materials

John T. Markert, Troy C. Messina, Bernard Dam, Jeroen Huijbregste, Jan H. Rector, Ronald Griessen

Proceedings Volume 4058, Superconducting and Related Oxides: Physics and Nanoengineering IV; (2000) https://doi.org/10.1117/12.397832
Event: AeroSense 2000, 2000, Orlando, FL, United States

Abstract

We report laser-ablation studies of highly-oriented thin films of the electron-doped infinite-layer copper-oxide compounds Sr_{1- x}La_xCuO₂. The primary synthesis variables were substrate or buffer layer material, temperature, laser fluence, target- substrate distance, and oxygen pressure. The films were characterized by x-ray diffraction, atomic force microscopy (AFM), Rutherford back-scattering (RBS), and electrical resistivity. Films were deposited on strontium titanate (001) or on buffer layers of T'-phase copper oxides, Ln₂CuO₄ (Ln equals Pr, Sm) on SrTiO₃ (001). The in-plane lattice constants of such T'-phase materials (a equals 0.391 - 0.396 nm) could provide a structure more amenable to electron doping than strontium titanate (a equals 0.390 nm). Extremely flat buffer layers were obtained from stoichiometric targets of Sm₂CuO₄ and Pr₂CuO₄. However, ablation from stoichiometric infinite-layer targets onto buffer layers resulted in mixtures of infinite-layer and chain/ladder phases. Non-stoichiometric deposition was confirmed by RBS analysis. We thus utilized non-stoichiometric targets to obtain single-phased infinite-layer films. The x-ray rocking curves of highly-oriented epitaxial infinite-layer films exhibited full- widths at half maximum as narrow as 0.05 degrees. Infinite-layer films grown on T'-phase buffer layers exhibited lattice constants closer to those of the bulk superconductor than films grown directly on SrTiO₃.

Citation Download Citation

John T. Markert, Troy C. Messina, Bernard Dam, Jeroen Huijbregste, Jan H. Rector, and Ronald Griessen "Laser-ablated thin films of infinite-layer compounds and related materials", Proc. SPIE 4058, Superconducting and Related Oxides: Physics and Nanoengineering IV, (6 September 2000); https://doi.org/10.1117/12.397832

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available