Paper
28 November 1983 Thin Transition-Metal Nitride Films With Surface Roughness For Application As Selective Absorbers In Evacuated Solar Collectors
E. Vogelzang, A. A.M.T. van Heereveld, M. Sikkens
Author Affiliations +
Proceedings Volume 0401, Thin Film Technologies I; (1983) https://doi.org/10.1117/12.935540
Event: 1983 International Technical Conference/Europe, 1983, Geneva, Switzerland
Abstract
Chromium nitride (CrNx) layers have been prepared by d.c. reactive sputtering of chromium in an argon-nitrogen atmosphere. Structural, electrical and optical properties of samples, deposited at various nitrogen pressures, have been determined. Spectrally selective CrNx layers on a polished copper substrate show a moderate solar absorptance (αs≈ = 0.80) and a low thermal emittance(εn 0.04). The absorptance has been improved by depositing CrNx films on a rough copper base-layer. The thermal stability in vacuum and the corrosion resistance of CrNx, samples have been tested.
© (1983) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
E. Vogelzang, A. A.M.T. van Heereveld, and M. Sikkens "Thin Transition-Metal Nitride Films With Surface Roughness For Application As Selective Absorbers In Evacuated Solar Collectors", Proc. SPIE 0401, Thin Film Technologies I, (28 November 1983); https://doi.org/10.1117/12.935540
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KEYWORDS
Copper

Chromium

Nitrogen

Protactinium

Reflectivity

Polishing

Sputter deposition

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