Paper
21 July 2000 Large-area nanoimprint fabrication of sub-100-nm interdigitated metal arrays
Lars Montelius, Babak Heidari, Mariusz Graczyk, Torbjoern Ling, Ivan Maximov, Eva-Lena Sarwe
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Abstract
Nanoimprint lithography over 2 inch wafers with a patterned area of 40,000 micrometer squared consisting of interdigitated lines of 100 nm width with varying distance between the lines has been performed. By performing metal lift-off and subsequent UV-lithography for definition of contact regions and pads, complete metal arrays have been fabricated. The structure is electrically characterized by admittance spectroscopy. In this paper we describe the design and realization of a compact nanoimprint lithography system. Furthermore, various aspects of nanoimprint lithography are discussed, and nanoimprint lithography is compared with other nanostructuring technologies.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lars Montelius, Babak Heidari, Mariusz Graczyk, Torbjoern Ling, Ivan Maximov, and Eva-Lena Sarwe "Large-area nanoimprint fabrication of sub-100-nm interdigitated metal arrays", Proc. SPIE 3997, Emerging Lithographic Technologies IV, (21 July 2000); https://doi.org/10.1117/12.390081
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Cited by 11 scholarly publications.
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KEYWORDS
Nanoimprint lithography

Semiconducting wafers

Metals

Polymethylmethacrylate

Nanolithography

Etching

Lithography

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