Microscopic observation of laser-induced forward transfer process by two-dimensional laser-induced fluorescence technique

Yoshiki Nakata; Tatsuo Okada; Mitsuo Maeda

doi:10.1117/12.387584

7 June 2000 Microscopic observation of laser-induced forward transfer process by two-dimensional laser-induced fluorescence technique

Yoshiki Nakata, Tatsuo Okada, Mitsuo Maeda

Author Affiliations +

Proceedings Volume 3933, Laser Applications in Microelectronic and Optoelectronic Manufacturing V; (2000) https://doi.org/10.1117/12.387584
Event: Symposium on High-Power Lasers and Applications, 2000, San Jose, CA, United States

Abstract

The behaviors of atomic particles and droplets in laser-induced forward transfer (LIFT) process were observed by two-dimensional laser-induced fluorescence (2D-LIF) technique and by thermal emission detection. The behavior of the ejected particles in gas phase was observed with different parameters such as ablation laser energy, film thickness, gas pressure. The interaction of the particles with substrate was also observed.

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Yoshiki Nakata, Tatsuo Okada, and Mitsuo Maeda "Microscopic observation of laser-induced forward transfer process by two-dimensional laser-induced fluorescence technique", Proc. SPIE 3933, Laser Applications in Microelectronic and Optoelectronic Manufacturing V, (7 June 2000); https://doi.org/10.1117/12.387584

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