Noise measurement used for reliability screening of optoelectronic coupled devices (OCDs)

Jiansheng Xu; Derek Abbott; Yisong Dai

doi:10.1117/12.368428

8 October 1999 Noise measurement used for reliability screening of optoelectronic coupled devices (OCDs)

Jiansheng Xu, Derek Abbott, Yisong Dai

Proceedings Volume 3893, Design, Characterization, and Packaging for MEMS and Microelectronics; (1999) https://doi.org/10.1117/12.368428
Event: Asia Pacific Symposium on Microelectronics and MEMS, 1999, Gold Coast, Australia

Abstract

In this paper the theoretical analysis of noise sources in OCDs is given and the relation between typical defects and 1/f, g-r and burst noise is described. According to statistical results, a threshold to screen potential devices with excess noise is derived. It has been proved both in theory and by experiment that the screening criterion proposed is reasonable. Moreover, the experimental results show that the screening method of OCDs is of practical value.

Citation Download Citation

Jiansheng Xu, Derek Abbott, and Yisong Dai "Noise measurement used for reliability screening of optoelectronic coupled devices (OCDs)", Proc. SPIE 3893, Design, Characterization, and Packaging for MEMS and Microelectronics, (8 October 1999); https://doi.org/10.1117/12.368428

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