Paper
9 September 1999 THz imaging in a Brewster-angle configuration: characterization of thin oxide coatings for fuel cell applications
M. Brucherseifer, Peter Haring Bolivar, Hans Hermann Klingenberg, Heinrich Kurz
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Proceedings Volume 3828, Terahertz Spectroscopy and Applications II; (1999) https://doi.org/10.1117/12.361053
Event: Industrial Lasers and Inspection (EUROPTO Series), 1999, Munich, Germany
Abstract
Time-resolved THz imaging for the incidence-angle dependent 3D tomographic characterization of layered structures is presented. We illustrate the capabilities of the developed system on multi-layer ceramic samples used for solid oxide fuel cells. Diverse methods for determining unknown refractive indices are discussed. The significant influence of the angle of incidence of a THz imaging system on the measured signal is demonstrated, which can be exploited especially in Brewster-angle configurations to enhance the capabilities of any THz tomography system.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. Brucherseifer, Peter Haring Bolivar, Hans Hermann Klingenberg, and Heinrich Kurz "THz imaging in a Brewster-angle configuration: characterization of thin oxide coatings for fuel cell applications", Proc. SPIE 3828, Terahertz Spectroscopy and Applications II, (9 September 1999); https://doi.org/10.1117/12.361053
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KEYWORDS
Terahertz radiation

Refractive index

Tomography

Reflection

Oxides

Imaging systems

Interfaces

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