Paper
9 September 1999 Measurements of magnetic resonance and high-frequency conductivity at low temperatures and high magnetic fields
J. M. Schrama, Eva Joanna Rzepniewski, Arzhang Ardavan, R. Edwards, A.-K. Klehe, A. Kornilov, J. Singleton
Author Affiliations +
Proceedings Volume 3828, Terahertz Spectroscopy and Applications II; (1999) https://doi.org/10.1117/12.361033
Event: Industrial Lasers and Inspection (EUROPTO Series), 1999, Munich, Germany
Abstract
We describe a range of techniques developed by the Oxford group for use in conjunction with the Millimeter-wave Vector Network Analyzer in measurements of magnetic resonance and high-frequency conductivity, at extremely low temperatures and high magnetic fields. Included are a variety of resonant cavity techniques. The cylindrical geometry is used to produce high-Q tunable cavities, ideally suited to measurements of the frequency and temperature dependence of, for example, cyclotron resonance of carriers in GaAs- (Ga,Al)As heterojunctions. A family of rectangular cavities has been designed specifically for measurements of the angle-dependent high-frequency conductivity of organic molecular metals; these systems allow us either to rotate the whole cavity in the external magnetic field, thus measuring the dependence of a particular component of the conductivity tensor on magnetic field orientation, or to rotate the sample within the cavity, thus measuring different components of the magneto-conductivity. We also describe a non-resonant measurement using a pressure cell with optical access permitting experiments at up to 1.8 GPa. Examples of data obtained from each technique are included.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. M. Schrama, Eva Joanna Rzepniewski, Arzhang Ardavan, R. Edwards, A.-K. Klehe, A. Kornilov, and J. Singleton "Measurements of magnetic resonance and high-frequency conductivity at low temperatures and high magnetic fields", Proc. SPIE 3828, Terahertz Spectroscopy and Applications II, (9 September 1999); https://doi.org/10.1117/12.361033
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KEYWORDS
Magnetism

Waveguides

Temperature metrology

Diodes

Head

Metals

Phase measurement

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