Variation in optical disk retardance measurements

Kent B. Rochford; Stephen T. Kreger; John W. West

doi:10.1117/12.371163

30 November 1999 Variation in optical disk retardance measurements

Kent B. Rochford, Stephen T. Kreger, John W. West

Proceedings Volume 3806, Recent Advances in Metrology, Characterization, and Standards for Optical Digital Data Disks; (1999) https://doi.org/10.1117/12.371163
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

An intercomparison of optical disc birefringence measurements using commercial instrumentation found in manufacturing settings showed significant measurement variation. We discuss possible sources of variation in these measurements, including changes in disc properties and coherence effects. We describe specific measurement errors related to deviations from circular input polarization in one class of polarimetric instruments. Efforts to mitigate measurement errors, such as the development of calibration artifacts, are discussed.

Citation Download Citation

Kent B. Rochford, Stephen T. Kreger, and John W. West "Variation in optical disk retardance measurements", Proc. SPIE 3806, Recent Advances in Metrology, Characterization, and Standards for Optical Digital Data Disks, (30 November 1999); https://doi.org/10.1117/12.371163

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