Methods for characterization of phase change optical disks

Jerome Butty; Denis Kraehenbuehl; Brian Josef Bartholomeusz; Serguei Mikhailov; Masaru Suzuki

doi:10.1117/12.371148

30 November 1999 Methods for characterization of phase change optical disks

Jerome Butty, Denis Kraehenbuehl, Brian Josef Bartholomeusz, Serguei Mikhailov, Masaru Suzuki

Proceedings Volume 3806, Recent Advances in Metrology, Characterization, and Standards for Optical Digital Data Disks; (1999) https://doi.org/10.1117/12.371148
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

Characterization methods of AgInSbTe based phase change optical disc are developed. Reflectivity change of as deposited multilayer structure with changing thickness is measured. The active layer thickness influence on reflectivity is compared with calculated results. We show that Rutherford Back Scattering (RBS) spectroscopy can be used to analyze the composition of the active layer. The X-ray diffraction pattern of CD-RW discs is presented, for both as deposited and initialized case. The TEM image reveals the particular crystal growth mechanism of AgInSbTe quaternary system. Written discs write power window is shown at 2X and 4X write speed.

Citation Download Citation

Jerome Butty, Denis Kraehenbuehl, Brian Josef Bartholomeusz, Serguei Mikhailov, and Masaru Suzuki "Methods for characterization of phase change optical disks", Proc. SPIE 3806, Recent Advances in Metrology, Characterization, and Standards for Optical Digital Data Disks, (30 November 1999); https://doi.org/10.1117/12.371148

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