Growth and characterization of single-crystal organic thin films for electro-optic modulators

Alexander Leyderman; Yulong Cui; Javier Wu Li; Sergey S. Sarkisov; Michael J. Curley; Curtis E. Banks; Benjamin G. Penn

doi:10.1117/12.351425

28 June 1999 Growth and characterization of single-crystal organic thin films for electro-optic modulators

Alexander Leyderman, Yulong Cui, Javier Wu Li, Sergey S. Sarkisov, Michael J. Curley, Curtis E. Banks, Benjamin G. Penn

Proceedings Volume 3793, Operational Characteristics and Crystal Growth of Nonlinear Optical Materials; (1999) https://doi.org/10.1117/12.351425
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

Organic materials with large electro-optic coefficients are promising for fabrication of fast electro-optic modulators with low driving voltage. In this paper we describe the growth of micron-thick single crystal films of various electro-optic organic materials from melt using the plate- guided method. The compounds such as mNA, COANP, NPP, PNP, MBANP and DAST will be considered. The films are grown using a homemade facility, which allows to control melting and recrystallization rate and to observe the process with an optical polarizing microscope. A single crystal films will make up a planar optical waveguide integrated with a coupling prism. The light will be injected into the film using the prism. Then, after traveling a certain distance within the film, the light will be decoupled. Combination of high electro-optic coefficients of the film (10 to 100 pm/V) with relatively long travel distance of the light beam (5 mm and more) potentially gives a driving voltage of the phase modulation of the beam of 5 V and less. This is very important for the incorporation of the modulator into a standard low voltage electronic circuitry. The phase modulation can be converted into amplitude modulation using various interferometer schemes such as Mach-Zehnder (M-Z) scheme with external arm, M-Z with internal arm, polarimetric waveguide interferometer, and dual-mode single- arm interferometer. We will provide some experimental data showing the advantage of the dual-mode single-arm scheme. Potential modulation rate of the system can be 10 dB and higher.

Citation Download Citation

Alexander Leyderman, Yulong Cui, Javier Wu Li, Sergey S. Sarkisov, Michael J. Curley, Curtis E. Banks, and Benjamin G. Penn "Growth and characterization of single-crystal organic thin films for electro-optic modulators", Proc. SPIE 3793, Operational Characteristics and Crystal Growth of Nonlinear Optical Materials, (28 June 1999); https://doi.org/10.1117/12.351425

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KEYWORDS

Electro optics

Crystals

Prisms

Electrooptic modulators

Refractive index

Modulation

Interferometers

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