One- and two-dimensionally rough-surface radar backscatter cross section based on a stationary two-scale full-wave approach

Ezekiel Bahar; Paul E. Crittenden

doi:10.1117/12.366701

25 October 1999 One- and two-dimensionally rough-surface radar backscatter cross section based on a stationary two-scale full-wave approach

Ezekiel Bahar, Paul E. Crittenden

Author Affiliations +

Proceedings Volume 3784, Rough Surface Scattering and Contamination; (1999) https://doi.org/10.1117/12.366701
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

The full wave approach is applied to one and two dimensionally rough surfaces that are characterized by Gaussian surface height probability density functions. The full wave solutions are compared with published analytical and numerical solutions for one dimensional rough surfaces. The decomposition of the rough surface into smaller and larger rough scale surfaces is not restricted by the small perturbation limitations when the two-scale full wave approach is used. Thus the mean square height of the smaller scale surface is not restricted to small values. In the small slope limit, the total rough surface is regarded as a small scale surface and the corresponding solution is given by the single scatter original full wave solution. In the high frequency limit, the total rough surface is regarded as a large scale surface and the full wave solution reduces to the physical optics solution. For the intermediate two-scale case, the radar cross sections are obtained by regarding the rough surface as an ensemble of arbitrarily oriented patches of small scale surfaces that ride upon the large scale surface. The rough surface radar cross sections are expressed as weighted sums of two cross sections. It is shown that the full wave solutions are stationary over a wide range of patch sizes.

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Ezekiel Bahar and Paul E. Crittenden "One- and two-dimensionally rough-surface radar backscatter cross section based on a stationary two-scale full-wave approach", Proc. SPIE 3784, Rough Surface Scattering and Contamination, (25 October 1999); https://doi.org/10.1117/12.366701

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