Simplified spectral imaging using a pair of CCD's with filters for shape measurement

Xiaoli L. Dai; Kaoru Minoshima; Katuo Seta

doi:10.1117/12.369199

11 November 1999 Simplified spectral imaging using a pair of CCD's with filters for shape measurement

Xiaoli L. Dai, Kaoru Minoshima, Katuo Seta

Proceedings Volume 3782, Optical Manufacturing and Testing III; (1999) https://doi.org/10.1117/12.369199
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

For real-time 3D imaging using chirped optical pulses and a femtosecond optical Kerr shutter to measure the shape accurately, we need to develop a spectral imaging method which has a high-resolution in both space and spectrum. The spectral property of the light which is generated from the chirped pulse by the femtosecond optical Kerr shutter, the wavelength is measured as the line spectrum. Therefore, the wavelength can be determined by two detectors with different spectral properties. To obtain the line spectral image, we proposed a pair of filters, the transmissivities of which vary monotonously with the wavelength, one increases with the wavelength, the other decreases. Since the ratio between the transmissivities of the two filters changes monotonously for wavelength range of 550 - 750 nm, the wavelength of line spectrum is determined uniquely for the range with a simple function of the ratio. These filters were set in front of two monochromatic CCDs which are aligned to take an image. The resolution to determine the wavelength is tested with a monochrometer and the standard deviation for each pixel is estimated to be about 10 nm. Compared the methods of color CCD and spectrometer, this method of pair-CCDs has high spatial resolution, uniform spectral resolution, wide spectral measurement range, and simple setup.

Citation Download Citation

Xiaoli L. Dai, Kaoru Minoshima, and Katuo Seta "Simplified spectral imaging using a pair of CCD's with filters for shape measurement", Proc. SPIE 3782, Optical Manufacturing and Testing III, (11 November 1999); https://doi.org/10.1117/12.369199

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