New versatile x-ray analyzer using capillary focusing in the micrometer scale

Charles Burggraf; Paul Fougeres; Chris Burggraf; Makram Hage-Ali; Jean Marie Koebel; A. Krauth; R. Regal; J. L. Baltzinger; Paul Siffert

doi:10.1117/12.366578

19 October 1999 New versatile x-ray analyzer using capillary focusing in the micrometer scale

Charles Burggraf, Paul Fougeres, Chris Burggraf, Makram Hage-Ali, Jean Marie Koebel, A. Krauth, R. Regal, J. L. Baltzinger, Paul Siffert

Author Affiliations +

Proceedings Volume 3768, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics; (1999) https://doi.org/10.1117/12.366578
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

In this paper, we will give first the description of a versatile material analyzer for x-ray crystallographic and compositional analyses. We will describe how we calculate and elaborate glass capillaries; we will describe some important parameters of the total reflection of x-rays: focusing, transparency, gain and divergence. Our first results concern a compositional study of CdZnTe crystals with a n x-ray beam diameter of 10 micrometers and we will show the variation of Zn on the surface of such a crystal. Another possibility of this device is x-ray microtopography of a film or of a wafer. We show, on one hand the way to find in classical centers by Laue micropatterns on the other hand we could establish a Bragg reflection pattern like those obtained in classical x-ray surface topography. In some heat treatments we can see so-called texture effects. We have also on our device the possibility to see microtexture effects in a way which can be compared to the Seeman-Bohlin experiment. The compositional experiments were also tested by SEM in order to see how these two devices complete each other. We can notice in some studies the advantages of x-rays because photons are less destructive than electrons.

Citation Download Citation

Charles Burggraf, Paul Fougeres, Chris Burggraf, Makram Hage-Ali, Jean Marie Koebel, A. Krauth, R. Regal, J. L. Baltzinger, and Paul Siffert "New versatile x-ray analyzer using capillary focusing in the micrometer scale", Proc. SPIE 3768, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics, (19 October 1999); https://doi.org/10.1117/12.366578

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
8 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

X-rays

Capillaries

Crystals

Reflection

Crystallography

X-ray fluorescence spectroscopy

Laser crystals

Show All Keywords

Keywords/Phrases

Search In:

Publication Years