Paper
23 November 1999 Recent development of doubly curved crystal focusing optics and their applications for micro XRF
Zewu Chen
Author Affiliations +
Abstract
Three-dimensional focusing of x-rays can be achieved by doubly-curved crystals through diffraction from a small laboratory x-ray source. Recently it has been demonstrated that an intense monochromatic x-ray microprobe can be obtained with the use of a doubly-curved mica crystal. Due to monochromatic excitation using doubly-curved crystal optics, exceptionally low background has been demonstrated in the application to micro x-ray fluorescence (MXRF). Low background and high intensity gain significantly improve the detection limit for MXRF. In this paper, the focusing and diffraction properties of a doubly-curved Johann point-focusing crystal optic for Cu K(alpha) x-rays from a microfocus x-ray source is presented. Experimental data on spot size, beam intensity, effect of source position for the optics, and MXRF spectra are discussed.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zewu Chen "Recent development of doubly curved crystal focusing optics and their applications for micro XRF", Proc. SPIE 3767, EUV, X-Ray, and Neutron Optics and Sources, (23 November 1999); https://doi.org/10.1117/12.371109
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Cited by 1 scholarly publication.
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KEYWORDS
Crystals

Mica

Crystal optics

Silicon

X-rays

Copper

Nickel

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