Paper
19 July 1999 Multibeam Fizeau interferometer image plane
Author Affiliations +
Proceedings Volume 3749, 18th Congress of the International Commission for Optics; (1999) https://doi.org/10.1117/12.355010
Event: ICO XVIII 18th Congress of the International Commission for Optics, 1999, San Francisco, CA, United States
Abstract
Fizeau interferometer pattern analysis have carried out in the case of arbitrary slope beam illumination. Analysis get localization plane location (that is in coincidence with image plane) and its dependence on wedge relative index of refraction and on the interferometer entrance mirror slope angle to the incidence wave. The analyses fits experiment.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yuri N. Zakharov "Multibeam Fizeau interferometer image plane", Proc. SPIE 3749, 18th Congress of the International Commission for Optics, (19 July 1999); https://doi.org/10.1117/12.355010
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KEYWORDS
Mirrors

Fizeau interferometers

Wave propagation interference

Interferometers

Refraction

Color vision

Image processing

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