Investigation of the mixed-valent system V2-xMoxO5 by XPS

Mihaela Demeter; St. Bartkowski; E. Z. Kurmaev; M. Neumann; V. M. Cherkashenko; V. L. Volkov; G. C. Zakharova

doi:10.1117/12.343010

24 March 1999 Investigation of the mixed-valent system V_2-xMo_xO₅ by XPS

Mihaela Demeter, St. Bartkowski, E. Z. Kurmaev, M. Neumann, V. M. Cherkashenko, V. L. Volkov, G. C. Zakharova

Proceedings Volume 3724, International Conference on Solid State Crystals '98: Single Crystal Growth, Characterization, and Applications; (1999) https://doi.org/10.1117/12.343010
Event: International Conference on Solid State Crystals '98, 1998, Zakopane, Poland

Abstract

A series of V_2-xMo_xO₅ (x equals 0.2, 0.4, 0.6, 0.8) samples has been investigated by X-ray photoelectron spectroscopy (XPS). MoO₃, VO₂, V₂O₅ (powders), VO₂^(c) and Na_0.33V₂O₅^(c) have been used as reference samples. According to the XPS measurements, the valence of Mo atoms in this series is not changed during the Mo doping and it is close to that of MoO₃. The V atoms show a mixed valence in the V_2-xMo_xO₅ system: with increasing of the Mo content, a higher concentration of tetravalent V atoms is observed. For one sample of this series, V_1.2Mo_0.8O₅, it was found that the XPS valence band and also the core level spectra are close to those of another mixed- valence system, Na_0.33V₂O₅. Both compounds show similar electrical properties, which can be interpreted in terms of a two-level hopping model. It is concluded that the impurity states in the band gap of both compounds have 3d like character and they are formed at the expense of the additional electrons of Mo or Na.

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Mihaela Demeter, St. Bartkowski, E. Z. Kurmaev, M. Neumann, V. M. Cherkashenko, V. L. Volkov, and G. C. Zakharova "Investigation of the mixed-valent system V_2-xMo_xO₅ by XPS", Proc. SPIE 3724, International Conference on Solid State Crystals '98: Single Crystal Growth, Characterization, and Applications, (24 March 1999); https://doi.org/10.1117/12.343010

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