Photoresist removal using gaseous sulfur trioxide cleaning technology

Helene Del Puppo; Paul B. Bocian; Ahmad Waleh

doi:10.1117/12.350793

14 June 1999 Photoresist removal using gaseous sulfur trioxide cleaning technology

Helene Del Puppo, Paul B. Bocian, Ahmad Waleh

Proceedings Volume 3677, Metrology, Inspection, and Process Control for Microlithography XIII; (1999) https://doi.org/10.1117/12.350793
Event: Microlithography '99, 1999, Santa Clara, CA, United States

Abstract

A novel cleaning method for removing photoresists and organic polymers from semiconductor wafers is described. This non-plasma method uses anhydrous sulfur trioxide gas in a two-step process, during which, the substrate is first exposed to SO₃ vapor at relatively low temperatures and then is rinsed with de-ionized water. The process is radically different from conventional plasma-ashing methods in that the photoresist is not etched or removed during the exposure to SO₃. Rather, the removal of the modified photoresist takes place during the subsequent DI-water rinse step. The SO₃ process completely removes photoresist and polymer residues in many post-etch applications. Additional advantages of the process are absence of halogen gases and elimination of the need for other solvents and wet chemicals. The process also enjoys a very low cost of ownership and has minimal environmental impact. The SEM and SIMS surface analysis results are presented to show the effectiveness of gaseous SO₃ process after polysilicon, metal an oxide etch applications. The effects of both chlorine- and fluorine-based plasma chemistries on resist removal are described.

Citation Download Citation

Helene Del Puppo, Paul B. Bocian, and Ahmad Waleh "Photoresist removal using gaseous sulfur trioxide cleaning technology", Proc. SPIE 3677, Metrology, Inspection, and Process Control for Microlithography XIII, (14 June 1999); https://doi.org/10.1117/12.350793

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