Near-field microscopy of second harmonic generation

Igor I. Smolyaninov; Chi Hsiang Lee; Christopher C. Davis

doi:10.1117/12.347987

28 April 1999 Near-field microscopy of second harmonic generation

Igor I. Smolyaninov, Chi Hsiang Lee, Christopher C. Davis

Proceedings Volume 3666, International Conference on Fiber Optics and Photonics: Selected Papers from Photonics India '98; (1999) https://doi.org/10.1117/12.347987
Event: International Conference on Fiber Optics and Photonics: Selected Papers from Photonics India '98, 1998, New Delhi, India

Abstract

Near-field scanning optical microscopy (NSOM) allows simultaneous mapping of both the topography and optical properties of a surface with resolution below the diffraction limit. Second harmonic generation (SHG) always occurs at a surface, even for centro-symmetric media, because of symmetry breaking. By combining NSOM and SHG we can study local variations in symmetry breaking, caused for example by ferroelectric and ferromagnetic domains, and can correlate them with surface topography. We report NSOM/SHG measurements made on piezoelectric ceramics, ferromagnetic materials and periodic structures.

Citation Download Citation

Igor I. Smolyaninov, Chi Hsiang Lee, and Christopher C. Davis "Near-field microscopy of second harmonic generation", Proc. SPIE 3666, International Conference on Fiber Optics and Photonics: Selected Papers from Photonics India '98, (28 April 1999); https://doi.org/10.1117/12.347987

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