Paper
8 March 1999 Automatic evaluation of the appearance of seam puckers on suits
Tsunehiro Aibara, Takehiro Mabuchi, Kenji Ohue
Author Affiliations +
Abstract
This paper presents a method for the automatic evaluation of the appearance of seam puckers (SP) on suits. Presently, evaluations are done by inspectors who compare standard photographs to test samples. We regard the evaluation as pattern recognition, using the fractal dimensions as the features of SP. The first difficult point of automatic evaluation is that the gray levels of SP are often confused with the gray levels of material's texture. We solved the problem by distinguishing the SP from the texture using the concept of variance. For images containing SP we apply the contrast transform. By these processes, confusion is avoided. The second point is the calculation of fractal dimensions. In order to make it easy to calculate fractal dimensions, we make a curve representing the property of SP. From the curve fractal dimension is calculated. Twenty suits were used as test patterns for the evaluation experiment, and a good result was obtained. We also made an evaluation system using Daubechies' wavelet and compared it with the present system. The evaluation results obtained by the system using the fractal dimensions showed a better result than that of the wavelet feature.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tsunehiro Aibara, Takehiro Mabuchi, and Kenji Ohue "Automatic evaluation of the appearance of seam puckers on suits", Proc. SPIE 3652, Machine Vision Applications in Industrial Inspection VII, (8 March 1999); https://doi.org/10.1117/12.341130
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CITATIONS
Cited by 9 scholarly publications.
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KEYWORDS
Surface plasmons

Fractal analysis

Wavelets

Photography

Inspection

Bandpass filters

Linear filtering

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