Paper
17 June 1999 Restoration of collection-mode scanning near-field optical microscope image
Zhiyang Li, Xianfang Li, Wu Liu
Author Affiliations +
Proceedings Volume 3607, Scanning and Force Microscopies for Biomedical Applications; (1999) https://doi.org/10.1117/12.350629
Event: BiOS '99 International Biomedical Optics Symposium, 1999, San Jose, CA, United States
Abstract
Recently we have derived the angular spectrum transfer function (ASTF) for photon scanning tunneling microscope and collection mode scanning near field optical microscope (collection-SNOM) under dark illumination. The paper present discussed image restoration using the ASTF. It was found that the key to achieve better restoration is to find a ASTF as close to that of the system as possible, which then depends on the determination of tip size, tip sample distance, incident angle of illuminating laser beam, etc. When low values are used for tip diameter and tip sample distance improvement of image quality is obvious after restoration. But when the value adopted for tip sample distance is 0.05 (lambda) higher than real one, high frequency oscillation in the restored image become intolerable, which we call over restoration. Slight over restoration was also observed when the value employed for tip diameter is 0.02 (lambda) larger than real one. The appearance of over restoration on the other hand can be utilized for the estimation of tip diameter and tip sample distance of the system. Generally the image seems more sensitive to tip sample distance than to tip size.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zhiyang Li, Xianfang Li, and Wu Liu "Restoration of collection-mode scanning near-field optical microscope image", Proc. SPIE 3607, Scanning and Force Microscopies for Biomedical Applications, (17 June 1999); https://doi.org/10.1117/12.350629
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KEYWORDS
Image restoration

Near field scanning optical microscopy

Lithium

Optical microscopes

Scanning tunneling microscopy

Image quality

Near field optics

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