Paper
11 August 1998 Acquiring sine grating pattern of dynamic varying frequency for measuring MTF of CCD
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Abstract
This paper presents a method for acquiring sine grating pattern of dynamic varying frequency using for measuring the modulation transfer function (MTF) of CCD. The measured results show that the spatial frequencies of grating patterns generated by this method can be continuously changed within the range of 0.2 to 80 lp/mm, the frequent of which is lower than 1 lp/mm. The modulation contrast of patterns is close to one. We have used them to measure the MTF of area array and linear CCD, and the result are satisfactory.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Min Song, Yefang Li, Yi Sun, and Jia-sheng Hu "Acquiring sine grating pattern of dynamic varying frequency for measuring MTF of CCD", Proc. SPIE 3553, Detectors, Focal Plane Arrays, and Imaging Devices II, (11 August 1998); https://doi.org/10.1117/12.318076
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KEYWORDS
Modulation transfer functions

Charge-coupled devices

Spatial frequencies

Modulation

Speckle

Mirrors

Collimation

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