Near-infrared diffuse reflectance fiber optic spectroscopy for process monitoring applications

Steven C. Switalski; Todd Colin; Neil Redden; Eric Stahlecker; Vijay Parthasarathy

doi:10.1117/12.335742

11 January 1999 Near-infrared diffuse reflectance fiber optic spectroscopy for process monitoring applications

Steven C. Switalski, Todd Colin, Neil Redden, Eric Stahlecker, Vijay Parthasarathy

Proceedings Volume 3538, Process Monitoring with Optical Fibers and Harsh Environment Sensors; (1999) https://doi.org/10.1117/12.335742
Event: Photonics East (ISAM, VVDC, IEMB), 1998, Boston, MA, United States

Abstract

We have used fiber optic remote process to monitor processes at Kodak in the lab, in development or pilot, and in production. This talk will examine the use of near IR (NIR) diffuse reflectance spectroscopy as a process technology. Diffuse reflectance spectroscopy offers the capability of looking at powders, slurries, emulsions, and dispersions. Unlike attenuated total internal reflectance spectroscopy, diffuse reflectance offers the capability of interrogating both the liquid and solid phases of the material. This provides the ability to examine the physical state of the solid, such as particle size and morphology, even in a slurry, or in the presence of large amounts of solvent, in addition to the chemical quality of the solution. The use of the NIR spectral region provides the advantages of high signal-to-noise ratio, impressive photometric stability, and commercially available instrumentation, probes and optical fiber cable. Some representative examples will be presented to demonstrate the capabilities of diffuse reflectance spectroscopy for process monitoring with fiber optics.

Citation Download Citation

Steven C. Switalski, Todd Colin, Neil Redden, Eric Stahlecker, and Vijay Parthasarathy "Near-infrared diffuse reflectance fiber optic spectroscopy for process monitoring applications", Proc. SPIE 3538, Process Monitoring with Optical Fibers and Harsh Environment Sensors, (11 January 1999); https://doi.org/10.1117/12.335742

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