Characterization of snap-back breakdown and its temperature dependence up to 300 degrees C including circuit-level model and simulation

Dirk Uffmann

doi:10.1117/12.324393

28 August 1998 Characterization of snap-back breakdown and its temperature dependence up to 300°C including circuit-level model and simulation

Dirk Uffmann

Author Affiliations +

Proceedings Volume 3510, Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV; (1998) https://doi.org/10.1117/12.324393
Event: Microelectronic Manufacturing, 1998, Santa Clara, CA, United States

Abstract

The MOS snap-back phenomenon and its temperature dependence were investigated up to 300 degrees C by measurement, parameter extraction and simulation using silicided LDD-NMOS transistors. The snap-back sustaining voltage increases from 8.25V at room temperature to 8.9V at 300 degrees C. By using extracted parameters for a simple lumped element model we explain this behavior originating from an increasing avalanche breakdown voltage and increasing exponential slope of avalanche multiplication factor compensating the increase in bipolar gain with temperature. The simulation of IV- curves on circuit level using PSPICE shows an acceptable matching to the measured IV-curves. If the extracted parameters describing snap back would be specified in process documents, circuit designers could use them to identify and solve problems related to both ESD protection circuits and EOS. The results are also relevant for high temperature operation of electronics, which is a performance issue of growing importance.

Citation Download Citation

Dirk Uffmann "Characterization of snap-back breakdown and its temperature dependence up to 300°C including circuit-level model and simulation", Proc. SPIE 3510, Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV, (28 August 1998); https://doi.org/10.1117/12.324393

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available