Paper
18 September 1998 Characterization of CdTe:Fe crystals by means of transient holography
Vladyslav I. Volkov, Anatoly A. Borshch, Michail S. Brodyn, Valentin I. Rudenko
Author Affiliations +
Proceedings Volume 3486, International Conference on Optical Holography and its Applications; (1998) https://doi.org/10.1117/12.323772
Event: International Conference on Optical Holography and Its Applications, 1997, Kiev, Ukraine
Abstract
Measurements are presented for the photorefractive grating recording under pulsed excitation in the crystal of CdTe doped by Fe. The crystal under study is characterized by high electron mobility in comparison with typcial value. The photorefractive parameters of the crystal such as gain factor, Debye screening length, effective density of charge traps as well effective electro-optic constant have been measured on the basis of gain/grating spacing, gain/crystal rotation angle at different recording beam polarizations, and gain/intensity at different crystal orientations dependencies. The electron-hole competition influence on the crystal photorefractive performance is discussed. The fast photorefractive effect was shown to occur under pulsed excitation maximum gain factor, (Gamma) , being equal to approximately 0.3cm-1 without any externa electric field. Different self-action effects accompany two-beam coupling are discussed. These are two photon absorption, free carrier generation, self-action of laser beams. The photorefractive effect was separated in its pure form from the various nonlinear optical phenomena.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Vladyslav I. Volkov, Anatoly A. Borshch, Michail S. Brodyn, and Valentin I. Rudenko "Characterization of CdTe:Fe crystals by means of transient holography", Proc. SPIE 3486, International Conference on Optical Holography and its Applications, (18 September 1998); https://doi.org/10.1117/12.323772
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KEYWORDS
Crystals

Energy transfer

Photorefraction

Crystallography

Absorption

Semiconductors

Holography

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